S530 Parametric Test System Test Subroutine Library User's Manual
Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015
3-29
fndtrg
This subroutine determines which native mode trigger to use.
Usage
int fndtrg(double
low
, double
high
)
low
Input
The low value
high
Input
The high value
Returns
Output
TRUE
= Use the Less Than trigger
FALSE
= Use the Greater Than trigger
Details
This subroutine compares the algebraic magnitudes of the input parameters and sets its return value
TRUE
if TRIGL should be used or
FALSE
if TRIGH should be used.
Example
result = fndtrg(low, high)
fvmi
This primitive subroutine forces a voltage and measures a current on a device with four input pins and four ground
pins.
Usage
double fvmi(int
h1
, int
h2
, int
h3
, int
h4
, int
l1
, int
l2
, int
l3
, int
l4
, double
v
, double *
i
);
h1
Input
HI pin 1
h2
Input
HI pin 2
h3
Input
HI pin 3
h4
Input
HI pin 4
l1
Input
LO pin 1
l2
Input
LO pin 2
l3
Input
LO pin 3
l4
Input
LO pin 4
v
Input
Forced voltage, in volts
i
Output
Measured current
Returns
Output
Measured current:
0.0 = All high or low pins are < 1
+4.0E+21 = Measured voltage is within 98 % of the default current
limit
Details
This subroutine is normally used for defect structures with multiple high pins and ground pins.
