8-6
Limit Tests and Digital I/O
Model 6487 Reference Manual
shows the basic limit testing flowchart expanded to include binning. Notice
that there are five possible output patterns (one pass pattern and four fail patterns), but
only one will be sent to the component handler for each DUT that is tested.
Figure 8-5
Operation model for limit testing with binning
Pass
?
Start
Measure
DUT
Yes
Limit 1
Test
No
Display
“L1”
Limit 2
Test
Pass
?
Display
“L2”
Display “OK” and
Output Pass Pattern
Yes
No
End
Which
Limit
Failed
?
Output Fail
Pattern
HI Limit
Failure
Output Fail
Pattern
LO Limit
Failure
Which
Limit
Failed
?
Output Fail
Pattern
HI Limit
Failure
Output Fail
Pattern
LO Limit
Failure
Test
Another
DUT
?
No
Yes
