Model 4200A-SCS Parameter Analyzer Reference Manual
Section 6: Clarius
4200A-901-01 Rev. C / February 2017
6-349
Using a switch matrix
A limitation of the no-switch, direct connect test configuration shown in the figure below is that only
three devices can be measured. The test would have to be manually reconfigured or re-cabled to test
other devices.
Without a switch matrix, the number of adjacent cells that can be measured is limited. Therefore, it is
recommended that a switch matrix be used for disturb testing.
Using a switch matrix allows the flexibility of routing pulse and DC signals without having to make
connection changes. Also, this type of structure uses a multi-pin probe card, which provides an
additional opportunity for mapping test resources to DUT pins. For example, a SMU can be shared
across multiple device terminals where the required voltage is the same.
Figure 407: Disturb testing - configuration to test a single device
