Keithley 4200-SCS, User Manual

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4200-900-01 Rev. K / February 2017 Return to Section Topics 3-115
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
Flash connections
The Flash package includes all the necessary cables and adapters required for
the test connections. Also included is an 8 in-lb torque wrench for tightening the
SMA connections.
The 4200-SCS Flash package has four channels of multi-level pulse capability.
The number of SMUs is configurable. For a system without switching, it is best to
have four SMUs, to match the number of pulse channels to connect to a three or
four terminal DUT.
For a direct connect configuration, the minimum number of pulse channels is
equal to the number of DUT terminals that need to be simultaneously pulsed,
including terminals that must change from connected to disconnected, or open,
states (see
Figure 3-82 and Figure 3-88 ), for either the program or erase
condition.
The minimum number of SMUs is determined by the measurement tests and the
number of DUT terminals.
NOTE The 4205-PG2 card is referred to as a VPU, voltage pulse unit, in the software.
Figure 3-98 shows the items that are supplied with the Flash package.
Interconnect diagrams for flash testing are shown in Figure 3-95 , Figure 3-96 and
Figure 3-97 . Figure 3-95 shows the connections for test configuration shown in
Figure 3-85 and Figure 3-89 , which is used for both initial program/erase
investigation and endurance testing of a direct connect DUT.
This configuration does not require a switch matrix, and provides four channels of
pulse and well as four SMUs, to permit full characterization of single (non-array)
NVM DUT.