Kaya Instruments JetCam, User Manual

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www.kayainstruments.com Page no. 43 | Configuration Interface
Table 24 – Test Control parameters
7.10.2 Build-In-Test
The Build-In-Test (BIT) implements option to check individual camera’s interfaces to insure correct behavior in the
allowed range.
Each test may result in “Pass”, “Fail” or “Unsupported” with appropriate error report, either by starting individual
test or all tests together.
Following describe each test functionality:
1.
Flash – Test the functionality of flash access.
2. Uart
(1)
– Test the functionality of the UART interface. (Loopback dongle should be mounted to perform this
test)
3. SensorControl – Test basic communication with the sensor by reading and comparing with a known default
value.
4. SensorLVDS – Test stream interface with the sensor using a known pattern.
5. Temperature – Test the temperature of several components; they must be in acceptable range.
6. Voltages – Test the analog voltages levels; they must be in acceptable range.
7. MACOM
(1)
– Test the speed configuration of the interface.
8. GPIO
(1)
– Test the functionality of the external GPIO interface. (Loopback dongle should be mounted to
perform this test)
Remarks:
1.
Not all camera models support this configuration.
5 Voltages
6 MACOM
7 GPIO
BIT Start Start selected BIT BITStart Command 1 - Activate
BIT Status BIT current status BITStatus Enumeration 0 Unknown
1 Pass
2 Fail
0xFF Unsupported
BIT Error Report BIT last error report
description BITErrorReport String