Datasheet
25
Electrical Specifications
2.6.3
V
CC
Overshoot
The processor can tolerate short transient overshoot events where V
CC
exceeds the VID
voltage when transitioning from a high to low current load condition. This overshoot
cannot exceed VID + V
OS_MAX
(V
OS_MAX
is the maximum allowable overshoot voltage).
The time duration of the overshoot event must not exceed T
OS_MAX
(T
OS_MAX
is the
maximum allowable time duration above VID). These specifications apply to the
processor die voltage as measured across the VCC_SENSE and VSS_SENSE lands.
NOTES:
1.
V
OS
is measured overshoot voltage.
2.
T
OS
is measured time duration above VID.
2.6.4
Die Voltage Validation
Overshoot events on processor must meet the specifications in
when
measured across the VCC_SENSE and VSS_SENSE lands. Overshoot events that are
< 10 ns in duration may be ignored. These measurements of processor die level
overshoot must be taken with a bandwidth limited oscilloscope set to a greater than or
equal to 100 MHz bandwidth limit.
Table 2-5.
V
CC
Overshoot Specifications
Symbol
Parameter
Min
Max
Unit
Figure
Notes
V
OS_MAX
Magnitude of V
CC
overshoot above
VID
—
50
mV
1
NOTES:
1.
Adherence to these specifications is required to ensure reliable processor operation.
T
OS_MAX
Time duration of V
CC
overshoot above
VID
—
25
µs
Figure 2-2. V
CC
Overshoot Example Waveform
Example Overshoot Waveform
0
5
10
15
20
25
Time [us]
Volta
g
e [V]
VID - 0.000
VID + 0.050
V
OS
T
OS
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID