Technical Reference Manual
002-29852 Rev. *B
14.2.8 FLASHC_FM_SRAM_ECC_CTL3
Description:
eCT Flash SRAM ECC control 3
Address:
0x402402BC
Offset:
0x2BC
Retention:
Retained
IsDeepSleep:
No
Comment:
Default:
0x1
Bit-field Table
Bits
7
6
5
4
3
2
1
0
Name
None [7:5]
ECC_INJ_E
N [4:4]
None [3:1]
ECC
_ENABLE
[0:0]
Bits
15
14
13
12
11
10
9
8
Name
None [15:9]
ECC_TEST
_FAIL [8:8]
Bits
23
22
21
20
19
18
17
16
Name
None [23:16]
Bits
31
30
29
28
27
26
25
24
Name
None [31:24]
Bit-fields
Bits Name
SW
HW
Default or
Enum
Description
0
ECC_ENABLE
RW
R
1
ECC generation/check enable for eCT Flash SRAM
memory.
4
ECC_INJ_EN
RW
RW1C
0
eCT Flash SRAM ECC error injection test enable.
Follow the steps below for ECC logic test:
1. Write corrupted or uncorrupted 39-bit data to
FM_SRAM_ECC_CTL0/1 registers.
2. Set the ECC_INJ_EN bit to '1'.
3. Confirm that the bit ECC_TEST_FAIL is '0'. If this is
not the case, start over at item 1 because the eCT
Flash was not idle.
4. Check the corrected data in
FM_SRAM_ECC_CTL2.
5. Confirm that fault was reported to fault structure,
and check syndrome (only applicable if
corrupted data was written in step 1).
6. If not finished, start over at 1 with different data.
8
ECC_TEST_FAIL
R
W
0
Status of ECC test.
1 : ECC test failed because eCT Flash macro is busy
and using the SRAM.
0: ECC was performed.
945
2022-04-18
TRAVEO™ T2G Automotive MCU: TVII-B-E-4M body controller entry registers