Technical Reference Manual
002-29852 Rev. *B
26.8.41 TST_XRES_SECURE
Description:
SECURE TEST and FIRMWARE TEST Key control register
Address:
0x40262054
Offset:
0x2054
Retention:
Retained
IsDeepSleep:
Yes
Comment:
When initialized with the correct 'magic' value, this register enables test modes that are
otherwise blocked in devices in NORMAL, SECURE life cycle stages and variants thereof.
Enabling the SECURE TEST key will automatically block access to secure portions of EFUSE
and/or FLASH.
Default:
0x0
Bit-field Table
Bits
7
6
5
4
3
2
1
0
Name
DATA8 [7:0]
Bits
15
14
13
12
11
10
9
8
Name
None [15:12]
FW_WR [11:8]
Bits
23
22
21
20
19
18
17
16
Name
None [23:20]
SECURE_WR [19:16]
Bits
31
30
29
28
27
26
25
24
Name
SECURE
_DISABLE
[31:31]
SECURE
_KEY_OK
[30:30]
FW_KEY
_OK [29:29]
None [28:24]
Bit-fields
Bits Name
SW
HW
Default or
Enum
Description
0:7
DATA8
RW
R
0
Data byte to be set into either SECURE TEST or
FIRMWARE TEST key. Must not be changed in the
same write that is toggling any of the *_WR bits below,
8:11
FW_WR
RW
R
0
Latch enables for each of the 4 bytes in the 32-bit
FIRMWARE TEST key. Must be toggled high and then
low while keeping DATA8 to the correct value.
16:19 SECURE_WR
RW
R
0
Latch enables for each of the 4 bytes in the 32-bit
SECURE TEST key. Must be toggled high and then
low while keeping DATA8 to the correct value.
29
FW_KEY_OK
R
RW
0
Indicates that the 32-bit FIRMWARE TEST key is
observing the correct key. Firmware key is reset by
(A)XRES and STRUCT_XRES.
30
SECURE_KEY_OK
R
RW
0
Indicates that the 32-bit SECURE TEST key is
observing the correct key. Secure key is not reset, but
it will establish low after a deep power cycle that
causes it to lose its written state.
31
SECURE_DISABLE
RW1S
R
0
Disables the SECURE TEST key entry capability until
next reset. Must not be set in the same write when any
of the above *_WR bits are set or toggling.
1687
2022-04-18
TRAVEO™ T2G Automotive MCU: TVII-B-E-4M body controller entry registers