Document Number: 001-98285 Rev. *R
Page 78 of 108
S29GL01GS/S29GL512S
S29GL256S/S29GL128S
11.4
AC Characteristics
11.4.1
Asynchronous Read Operations
Note:
1. Not 100% tested.
Table 11.3
Read Operation V
IO
= V
CC
= 2.7 V to 3.6 V (–40 °C to +85 °C)
Parameter
Description
Test Setup
Speed Option
Unit
JEDEC
Std
90
100
110
t
AVAV
t
RC
Read Cycle Time
128 Mb, 256 Mb
Min
90
100
–
ns
512 Mb, 1 Gb
–
100
110
t
AVQV
t
ACC
Address to Output Delay
CE# = V
IL
OE# = V
IL
128 Mb, 256 Mb
Max
90
100
–
ns
512 Mb, 1 Gb
–
100
110
t
ELQV
t
CE
Chip Enable to Output Delay
OE# = V
IL
128 Mb, 256 Mb
Max
90
100
–
ns
512 Mb, 1 Gb
–
100
110
t
PACC
Page Access Time
128 Mb, 256 Mb
Max
15
20
–
ns
512 Mb, 1 Gb
–
15
20
t
GLQV
t
OE
Output Enable to Output Delay
Max
25
ns
t
AXQX
t
OH
Output Hold time from addresses, CE# or OE#,
Whichever Occurs First
Min
0
ns
t
EHQZ
t
DF
Chip Enable or Output Enable to Output High-Z
Max
15
ns
t
OEH
Output Enable Hold Time
Read
Min
0
ns
Toggle and
Data# Polling
Min
10
ns
t
ASSB
Automatic Sleep to Standby time
CE# = V
IL
,
Address stable
Typ
5
µs
Max
8
µs
Table 11.4
Read Operation V
IO
= 1.65 V to V
CC
, V
CC
= 2.7 V to 3.6 V (–40 °C to +85 °C)
Parameter
Description
Test Setup
Speed Options
Unit
JEDEC
Std
100
110
120
t
AVAV
t
RC
128 Mb, 256 Mb
Min
100
110
–
ns
512 Mb, 1 Gb
–
110
120
t
AVQV
t
ACC
Address to Output Delay
CE# = V
IL
OE# = V
IL
128 Mb, 256 Mb
Max
100
110
–
ns
512 Mb, 1 Gb
–
110
120
t
ELQV
t
CE
Chip Enable to Output Delay OE# = V
IL
128 Mb, 256 Mb
Max
100
110
–
ns
512 Mb, 1 Gb
–
110
120
t
PACC
Page Access Time
128 Mb, 256 Mb
Max
25
30
–
ns
512 Mb, 1 Gb
–
25
30
t
GLQV
t
OE
Output Enable to Output Delay
Max
35
ns
t
AXQX
t
OH
Output Hold time from addresses, CE# or
OE#, Whichever Occurs First
Min
0
ns
t
EHQZ
t
DF
Chip Enable or Output Enable to Output High-
Z
Max
20
ns