SMART I - Drive Failure Prediction
SMART II - Off-Line Data Collection
SMART III - Off-Line Read Scanning with
Defect Reallocation
SMART IV - End-to-End CRC for hard drives
Predicts failures before they occur. Tracks fault prediction and failure indication
parameters such as re-allocated sector count, spin retry count, calibration retry count
By avoiding actual hard drive failures, SMART hard drives act as "insurance" against
unplanned user downtime and potential data loss from hard drive failure
IOEDC: I/O Error Detection Circuitry
Detects errors in Read/Write buffers on HDD cache RAM
Interface in F10 setup provides confirmation of SMART IV support.
QuickSpecs
HP Compaq 8200 Elite Series
Technical Specifications
DA - 13879 North America — Version 36 — August 15, 2013
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