Hioki SW1001, Instruction Manual, Page: 43 / 164

39
4
Scan Function
Thoroughly read "Usage Notes" (p. 4) beforehand.
4.1 Overview of the Scan Function
For scanning, specify the channel range (scan list) in advance and switch the channel in order.
Channel switching (scan channel moving forward) can be performed using EXT. I/O or
communications. Connecting the switch mainframe and the instrument EXT. I/O can switch the
channel and perform measurement in synchronization with the instrument.
This device
CH 1
↓
CH 2
↓
⁞
EXT. I/O SCAN signal
or
*
TRG
command
The channel is switched every time the signal is input.
Scanning in combination with the instrument
This device
CH 1
↓
CH 2
↓
⁞
CLOSE output signal
Instrument
External trigger
measurement executed
SCAN input signal
TRIG input
EOM output
EOM = Measurement completion signal
Set the instrument to the external trigger
mode.
Channel switching and external trigger measurement
synchronized for automatic execution
Precautions when performing a scan when the device and instrument are connected via EXT. I/O
• Only one instrument can be used.
• Use either the instrument’s data output function or its memory function to acquire measured
values from the scan. For more information, please see the instrument’s instruction manual.
• The EOM signal from the instrument may cause scan measurement to resume even if it has been
stopped using the SCAN_RESET signal or the
:ABORt
command.
For the EXT. I/O signal, see "Signal Functions" (p. 52).
4 Scan Function
4
Scan Function