Hioki ST5680, Instruction Manual, Page: 119 / 253

119
9
Panel Memory Function
Test condition settings are saved in the internal memory of the instrument.
Test conditions can be loaded in the following ways.
• Instrument key operation
• Communications command by each interface
• Inputting of a signal to external I/O terminal
See “12.2 External Input and Output Terminals and Signals” (p. 158).
Even if the instrument is turned off, the data saved in the internal memory is retained.
Test mode Data in memory Maximum number
of measured
values to be saved
in memory
DCW test Test voltage, start voltage, test time, voltage rising/falling
times, judgment waiting time, current judgment upper/lower-
limit values, arc detection function, offset canceling function/
current compensation value, contact-check threshold value/
compensation value, interval time
64
IR test Test voltage, test time, voltage rising/falling times, judgment
waiting time, resistance judgment upper/lower-limit values,
offset canceling function/resistance compensation value,
contact-check threshold value/compensation value, interval
time
64
Program test Test conditions/compensation value of each step, number of
test steps
30
BDV measurement Test method, initial voltage, end voltage, voltage rising
speed, voltage step, voltage holding time, number of steps,
arc detection function, distance between electrodes, upper
reference value, number of tests
10
1
Press [PANEL] on the measurement screen.
9 Panel Memory Function
Panel Memory Function
HIOKI ST5680A961-00