107
Memory Function
8.4
Memory Function
Saves the test results to the memory in the instrument. (1000 tests max.)
You can save the test results that have been stored to USB memory.
Further, you can acquire the saved data using communications commands.
The items saved by the memory function are described below.
• Measurement status
• Total judgment results
• Judgment functions judgment values and judgment results
IMPORTANT
• The test results are saved to internal memory in test mode only. The test results are not saved in test
conditions settings mode or BDV mode.
• If the memory function is enabled, the number of items presently stored in memory is displayed on the
measuring screen.
• Internal memory is automatically deleted if memory data is saved to USB memory or data is acquired
using communications commands.
• Acquire the measurement results saved inside the instrument either by saving them to USB memory or by
acquiring them using communications commands. For the memory data output format, see the memory
data acquisition commands in the “Communications Commands Instruction Manual” on the application
disk.
• If the instrument memory is full, subsequent measured values will not be saved. If restarting saving, either
read from the instrument internal memory, or delete memory data.
8
Other Functions
Summary of Contents for ST4030
Page 2: ......
Page 14: ...6 Usage Notes ...
Page 32: ...24 Inspecting before Measurement and Verifying Operations ...
Page 42: ...34 Table Copying ...
Page 108: ...100 Setting Dielectric Break down Judgment Conditions ...
Page 132: ...124 Terminal Open Error Setting ...
Page 198: ...190 Editing Files and Folders ...
Page 214: ...206 Interface Specifications ...
Page 248: ...240 Precautions when Processing Test Leads ...
Page 252: ...244 Index ...
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