Hioki RM3545, Instruction Manual, Page: 313 / 364

Appendix 1 Block Diagram
A1
A
ppend
ix
•
Constant current (determined by the measurement range) is applied between the
SOURCE B and SOURCE A terminals while voltage is measured between the SENSE B
and SENSE A terminals. The resistance value is obtained by dividing the measured volt-
age (
B ) by the constant current flow ( A ).
•
The effects of large offset voltages such as from thermal EMF can be reduced by current
flowing in the positive and negative directions (
A ).
•
The low-noise voltmeter can perform stable measurement, even with an integration time
of 0.3 ms (
B ).
•
When measurement starts, the contact check circuit ( C ) and constant current monitor ( D )
are activated to monitor for fault conditions while measuring.
•
The instrument incorporates a built-in temperature measurement circuit that can be used
to correct resistance measured values according to the temperature when measuring a
target that exhibits a high level of temperature dependence.
By separating the temperature measurement circuit from the constant current source, it is
possible to connect thermometers with analog output (
E ).
•
The high-speed CPU ( F ) provides ultra-high-speed measurements and fast system response.
•
Immunity from electrical noise is provided by isolation between the Measurement and
Control blocks (
G ).
•
The auto-ranging 100-to-240 V switching power supply ( H ) can provide stable measure-
ments even in poor power quality environments.
Appendix
Appendix 1 Block Diagram
G
F
H
D
A
B
C
C
E