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4.5 Setting Application Settings
110
Measurement waveform errors that occur when the test sample and instrument contact each other can be
detected by monitoring the voltage effective value and current effective value.
The voltage effective value and current effective value are calculated several times during analog measure-
ment.
The effective value of each of the voltage and current that is calculated the first time is treated as the refer-
ence value, and then following calculation expression is used to calculate the
% value for the voltage effec-
tive value and current effective value calculated for the second and subsequent times.
An error is detected when
% exceeds the set limit value.
4.5.4 Monitoring the Detection Level
(Monitoring the Detection Level Function)
% =
(Effective value - reference value)
reference value
×
100[%]
Procedure
LCR Initial Screen
Press
.
2
Application Settings
Application Settings
1
Summary of Contents for IM3570
Page 2: ......
Page 8: ...Contents vi ...
Page 16: ...Operating Precautions 8 ...
Page 34: ...1 3 Screen Configuration and Operation 26 ...
Page 138: ...4 5 Setting Application Settings 130 ...
Page 160: ...5 3 Normal Sweep 152 When the setting is Procedure Analyzer Initial Screen Press 2 1 ...
Page 272: ...5 10 Equivalent Circuit Analysis Function 264 ...
Page 336: ...9 4 Deleting a Panel 328 ...
Page 410: ...13 3 About Measurement Times and Measurement Speed 402 ...
Page 418: ...14 4 Discarding the Instrument 410 ...
Page 444: ...Appendix 13 Device Compliance Statement A26 ...
Page 447: ...Index3 Index Vertical Axis Scale 183 Voltage limit 60 78 ...
Page 448: ...Index4 ...
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