Genie Nano-CL C2450, User Manual

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Operational Reference Genie Nano-CL Series™
Internal Test Pattern Generator
The Genie Nano camera includes a number of internal test patterns which easily confirm camera
installations, without the need for a camera lens or proper lighting.
Use CamExpert to easily enable and select the any of the Nano test patterns from the drop menu
while the camera is not in acquisition mode. Select live grab to see the pattern output.
Note that internal test patterns are generated by the camera FPGA where the patterns are inserted
immediately after the sensor output in the processing chain and are the same maximum bit depth
as the sensor. The patterns are identical for monochrome or color camera models and subject to
processing operations.
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Note: Selecting the camera 8-bit output format displays the lower 8-bits of the processing path.
• Note: Processing such as Flat Field corrections and Shading corrections are not disabled
automatically. Therefore the test pattern ramps will seem to be lacking various gray levels
unless all processing features are off.
The Nano Test Patterns are:
• Grey Horizontal ramp: Image is filled horizontally with an image that goes from the darkest
possible value to the brightest.
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Grey Vertical ramp: Image is filled vertically with an image that goes from the darkest
possible value to the brightest.
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Grey Diagonal Ramp Moving: combination of the 2 previous schemes, but first pixel in image
is incremented by 1 between successive frames. This is a good pattern to indicate motion when
doing a continuous grab.