MSC8144E Reference Manual, Rev. 3
25-2
Freescale
Semiconductor
Debugging, Profiling, and Performance Monitoring
circuits and dedicated signals on the SC3400 core avoid sacrificing user-accessible internal
resource. As the DSP applications grow in both size and complexity, the OCE module provides
many features of the breakpoints, conditional breakpoints, breakpoints on data-bus values, and
event detection that offer the user non-destructive access to peripherals, variety in profiling, a
program tracing buffer, and real-time access to memory.
25.1.1 Overview
The MSC8144E TAP consists of five dedicated signal lines, a 16-state TAP controller, and three
test data registers. A Boundary Scan Register (BSR) links most of the device signal connections
into a single shift register. The test logic, which uses static logic design, is independent of the
device system logic. The MSC8144E JTAG can do the following:
Perform boundary scan operations to check circuit-board electrical continuity.
Bypass the MSC8144E for a given circuit-board test by effectively reducing the Boundary
Scan Register (BSR) to a single cell.
Sample the MSC8144E system connections during operation and transparently shift out
the result in the BSR. Preload values to outputs prior to circuit board testing.
Disable the drive to outputs during circuit board testing.
Access the OCE controller and circuits to control a target system.
Give entry to Debug mode.
Query identification information (manufacturer, part number and version) from an
MSC8144E-based device.
Force test data onto the outputs of an MSC8144E-based device while replacing its BSR in
the serial data path with a single-bit register.
Note:
Precautions must be taken to ensure that the IEEE Std. 1149.1-like test logic does not
interfere with non-test operation.
To access the JTAG registers, shift the appropriate command into the JTAG instruction register
and then shift the required value into the register. See Section 25.1.3 for a discussion of the
JTAG instructions. Figure 25-1 shows the MSC8144E JTAG 5-bit instruction register and the
following test registers:
Boundary Scan Register (BSR). Regarding the length of the BSR, The boundary scan bit
definitions vary according to the specific chip implementation of the MSC8144E and are
described by the BSDL file on the product website
1-bit Bypass Register
32-bit Identification Register (ID)
32
×
32-bit General-Purpose Register Bank (GSBI)
Test port access register
Summary of Contents for MSC8144E
Page 1: ...MSC8144E Reference Manual Quad Core Media Signal Processor MSC8144ERM Rev 3 July 2009 ...
Page 48: ...MSC8144E Reference Manual Rev 3 xlviii Freescale Semiconductor ...
Page 86: ...MSC8144E Reference Manual Rev 3 1 38 Freescale Semiconductor Overview ...
Page 168: ...MSC8144E Reference Manual Rev 3 3 60 Freescale Semiconductor External Signals ...
Page 242: ...MSC8144E Reference Manual Rev 3 5 26 Freescale Semiconductor Reset ...
Page 314: ...MSC8144E Reference Manual Rev 3 8 24 Freescale Semiconductor General Configuration Registers ...
Page 414: ...MSC8144E Reference Manual Rev 3 10 14 Freescale Semiconductor MSC8144E SC3400 DSP Subsystem ...
Page 452: ...MSC8144E Reference Manual Rev 3 11 38 Freescale Semiconductor Internal Memory Subsystem ...
Page 520: ...MSC8144E Reference Manual Rev 3 12 68 Freescale Semiconductor DDR SDRAM Memory Controller ...
Page 1070: ...MSC8144E Reference Manual Rev 3 21 28 Freescale Semiconductor Timers ...