FISCHER FISCHERSCOPE X-RAY XDLM 231, Operator'S Manual

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FISCHERSCOPE ® X-RAY 209
Features of WinFTM BASIC and LIGHT
2 Features of WinFTM BASIC and LIGHT
The following section describes the features of the software versions BASIC and LIGHT. If there are
restrictions in the LIGHT version, they are indicated in the text.
2.1 Integrated Technology

Coating thickness measurement and material analysis can be performed in one run.

Both operate standard-free as well.
2.2 Measurements Independent of the Substrate Material

During the measurement the substrate material is analyzed automatically. Thus, measurements
on different substrate materials can be performed without normalization in many cases. This
makes work much easier and saves time.
The reliability of the measurement result is increased, because the coating thickness is measured
correctly, even with hidden changes of the substrate material.
Even materials underneath the top coating can be analyzed without removing the top coating.

Function for taking into account the spectral background. The user can define the spectral back-
ground in the Def.MA. This function increases the accuracy of the analysis as long as a suitable
underground spectrum is available.
2.3 Coating Thickness Measurement
With the BASIC version max. 24 individual parameters of a specimen can be measured (thickness,
composition, element).
Examples:

A component is to be measured, that has 24 layers each consisting of one element.

A component is to be measured, that has one coating, which consists of a mixture of 24
elements.
With the LIGHT version max. 4 or 5 individual parameters of a specimen can be measured (thick-
ness: 4 elements, composition: 5 elements).
Examples:

A component is to be measured that has 4 layers each consisting of one element.

A component is to be measured that has one coating, which consists of a mixture of 5 elements.
Even individual elements, which may occur several times in different coatings of the coating system,
can be measured.