FISCHER FISCHERSCOPE X-RAY 5000 Series, Operator'S Manual, Page: 114 / 188

114 FISCHERSCOPE
®
X-RAY
Def.MA Creating a new Def.MA
15.2 Creating a new Def.MA
The creation of a new Def.MA in the thickness mode (see Table 15-1 on Page 113) is
described here. If you create a new Def.MA in another mode, the steps may differ.
Before you start
The WinFTM extension SUPER is activated.
Procedure
1. In the WinFTM main menu select Calibrate > Def.MA new... > <Mode, see
Table 15-1 on Page 113>.
The window
Definition of measuring conditions... appears.
2. In the field Label enter an explicit name for the new Def.MA file.
3. In the field located right above select the high voltage and the primary filter (if present).
The high voltage and the primary filter has to fit your measurement task.
Enter the layer composition of your specimen as follows:
Start with the top layer, continue with all other layers and end with the base material
(substrate material) as the last layer.
4. Click
New Layer .
The window Definition of Elements New Layer appears.
5. In the area Thickness select an option.
6. In the area Composition select an option.
7. Click Periodic system .
Component
mode For the analysis of specimens, which are not only composed of pure
elements, but also contain chemical compounds (e. g. oxides).
WinFTM offers a list of components, which can be used like ele-
ments.
The result display shows the measurement readings of the complete
components, not only the elements the components are composed
of.
Component
mode with bal-
ance For the analysis of bulk material (massive specimens), if the speci-
men cannot be defined completely by 100 percent and the specimen
is not only composed of pure elements, but also contain chemical
compounds (e. g. oxides).
The result display shows the measurement readings of the complete
components, not only the elements the components are composed
of.
Typical applications: recycling, RoHS, soil specimens, biological
specimens
Tab. 15-1: Def.MA Modes
Mode Application