FISCHER FISCHERSCOPE X-RAY 5000 Series, Operator'S Manual

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FISCHERSCOPE
®
X-RAY 5000 Series
158
Main Features
The instruments of the FISCHERSCOPE X-RAY 5000 series are innovative, energy
dispersive x-ray fluorescence measuring systems (EDXRF) for in-line applications in
industrial production sites. They are especially designed for continuous non-destruc-
tive analysis and measurement of thin layers and layer systems in production lines.
Their rugged design specifically meets the tough demands of industrial environments
and for continuous operation.
Typical fields of application:
• In the photovoltaic industry, e. g. CIGS, CIS, CdTe
• Measurements on glass panels, foils and belts
• Measurements on very hot surfaces (water cooled version)
The X-RAY 5000 instruments measure in a vacuum or in the atmosphere. With the
powerful semiconductor detectors, they can determine elements in the range of sodium
(11) to uranium (92).
Calibration is carried out quickly and easily with a master standard directly in the pro-
duction process. Due to large apertures, new semiconductor detectors and a digital
pulse processor, the X-RAY 5000 features outstanding repeatability, which reduces the
necessity for re-calibration, thereby saving time and effort.
Performance
FISCHERSCOPE X-RAY 5000 units are robust measurement heads and are simple to
mount.
For easy integration into production lines, the X-RAY 5000 comes with a standardized
mounting flange. Two versions are available:
• 5100 for measurements in the atmosphere
• 5400 for measurements in vacuum and on very hot substrates with surface tempera-
tures of up to 400 °C (752 °F)
For measurements in vacuum, the instrument is equipped with a special sealing
flange, which allows for maintaining the instrument without releasing the vacuum.
The entire operation and evaluation of measurements as well as the clear presentation
of measurement data is performed on a PC using the powerful and user-friendly
WinFTM® software. Additionally, the WinFTM
®
software offers the capability to com-
pensate variations in the distance of up to several millimeters between the measuring
head and the specimen for certain measurement applications.
Various data interfaces allow for easy integration of all X-RAY 5000 instruments into
industrial process control systems.
All X-RAY 5000 measuring systems fulfill DIN ISO 3497 and ASTM B 568.