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7 Calibration
7.5 Measurement Errors
216
7.5 Measurement Errors
Understanding of the source of measurement error and the way of error correction can help to improve the
measurement accuracy, as a certain degree of uncertainty still exits no matter how carefully the measurement is
done. The following kinds of errors may be produced in measurement with the analyzer.
7.5.1 Drift Errors
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Drift errors are produced by performance changes of the instrument or test system after calibration.
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The thermal expansion of the interconnected cables in the instrument and the performance changes of
microwave mixer are main causes of the drift error. The drift errors can be eliminated by recalibration.
➢
The duration of accurate calibration depends on the test environment. The stable environment can help to
minimize the drift error.
7.5.2 Random Errors
The random error cannot be predicted or eliminated by means of calibration. The influence on measurement results
can be reduced by some methods. Random errors are mainly divided into three types:
1) Random error of instrument
a) Electrical disturbance of internal components of the analyzer may result in random noise, mainly including:
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Low-level noise arising from the base noise within the receiver broadband;
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High-level noise or data trace jittering, which is mainly caused by the base noise inside the instrument and
phase noise of the LO source.
b) The random noise error can be reduced in the following methods:
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Increase the source power input into the DUT;
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Reduce the intermediate frequency bandwidth;
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Apply the function of sweep averaging.
2) Switch repeatability error
The switch is used to change attenuator settings of the source. If the switch acts, contact closing may be different
from previous closing sometimes. In this case, the measurement accuracy will be affected seriously. Therefore, the
attenuator settings should not be changed in high-accuracy measurement so as to reduce the switch repeatability
error.
3) Connector repeatability error
Connector wear may result in electrical performance changes. Proper connection maintenance can help to reduce
the connector repeatability error.
7.5.3 System Errors
System errors are caused by non-ideal hardware properties and may be repeatable (therefore, it can be predicted). It
is assumed that system errors do not change over time. System errors can be determined by calibration and
eliminated by mathematical calculation in measurement.
System errors cannot be fully eliminated. Due to limitations of the calibration process, some residual errors may
exist after calibration, mainly resulting from:
➢
Non-ideal calibration standard;
➢
Connector connection;
➢
Interconnected cable;
➢
Instrument.
All measurements are affected by the dynamic accuracy and frequency errors. For reflection measurement, relevant
residual errors include:
Summary of Contents for AV3672 Series
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Page 4: ...AV3672 Series Vector Network Analyzer Contents...
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Page 124: ...5 Menu 5 1 Menu structure 120 5 1 2 Track Fig 5 2 Track Menu...
Page 125: ...5 Menu 5 1 Menu structure 121 5 1 3 Channel Fig 5 3 Channel Menu...
Page 126: ...5 Menu 5 1 Menu structure 122 5 1 4 Excitation Fig 5 4 Excitation Menu I...
Page 127: ...5 Menu 5 1 Menu structure 123 Fig 5 5 Excitation Menu II...
Page 128: ...5 Menu 5 1 Menu structure 124 Fig 5 6 Excitation Menu III...
Page 129: ...5 Menu 5 1 Menu structure 125 5 1 5 Response Fig 5 7 Response Menu I...
Page 130: ...5 Menu 5 1 Menu structure 126 Fig 5 8 Repsonse Menu II...
Page 131: ...5 Menu 5 1 Menu structure 127 Fig 5 9 Response Menu III...
Page 132: ...5 Menu 5 1 Menu structure 128 Fig 5 10 Response Menu V Fig 5 11 Response IV...
Page 133: ...5 Menu 5 1 Menu structure 129 5 1 6 Calibration Fig 5 12 Calibration Menu...
Page 134: ...5 Menu 5 1 Menu structure 130 5 1 7 Marker Fig 5 13 Cursor Menu I...
Page 135: ...5 Menu 5 1 Menu structure 131 Fig 5 13 Cursor Menu II...
Page 136: ...5 Menu 5 1 Menu structure 132 Fig 5 15Marker Menu III...
Page 137: ...5 Menu 5 1 Menu structure 133 5 1 8 Analysis Fig 5 16 Analysis Menu I...
Page 138: ...5 Menu 5 1 Menu structure 134 Fig 5 17 Analysis Menu II...
Page 139: ...5 Menu 5 1 Menu structure 135 Fig 5 18 Analysis Menu III...
Page 140: ...5 Menu 5 1 Menu structure 136 5 1 9 System Fig 5 19 System Menu I...
Page 141: ...5 Menu 5 1 Menu structure 137 Fig 5 20 System Menu I...
Page 254: ...8 Basis of Network Measurement 8 3 Amplifier Parameter Specifications 250...
Page 257: ...8 Basis of Network Measurement 8 4 Complex Impedance 253...
Page 373: ...Appendix Appendix 4 Pulse Measurement 369 Fig 4 9 Receiver gain configuration Dialog Box...