Bruker VANTEC-1, User Manual

Page: 13 / 143

M88-E01072 2 - 1
2. Introduction
This manual covers installation and basic opera-
tion of the VÅNTEC-1 detector.
The VÅNTEC-1 detector features the fastest
simultaneous recording of X-ray diffraction pat-
terns within a wide 2-theta
angular range. When
performing XRD experiments, the detector can
be used either in fixed PSD mode (snapshot) or
in locked coupled mode (similar to using a zero-
dimensional scintillation counter). For powder
XRD, the VÅNTEC-1 offers a reduction of the
overall measurement time up to a factor of 100
in comparison to measurements executed with
the commonly used zero-dimensional detector
setup, providing a similar angular resolution.
Furthermore, the fixed 2-theta mode allows
measurement times down to 100 msec with
about 12° 2-theta coverage for executing in-situ
investigations like recording an “X-ray movie” of
kinetic processes.
The active area of the detector is 50 mm by 16
mm (along the scattering plane respectively per-
pendicular). The simultaneously-recorded angu-
lar range, as well as the achievable angular
resolution, are influenced by the sample proper-
ties, the selected measurement circle diameter,
the used slit openings and the applied X-ray
wavelength. Generally, the para-focusing
Bragg-Brentano geometry and a larger mea-
surement circle diameter result in a better angu-
lar resolution.
The VÅNTEC-1 detector is based on the pat-
ented Mikrogap
TM
technology. It offers all the
benefits common with gaseous detectors, such
as high signal amplification resulting in high
peak-to-background ratio, high sensitivity for a
wide range of X-ray wavelengths, and a good
energy resolution. The Mikrogap
TM
technology
allows operation at count rates much higher
than those typically possible with gaseous
detectors while maintaining all benefits.
The