BENNING IT 115
Device description
- 24 -
The maximum RCD tripping times vary from standard to standard.
The times specified in the individual standards are listed in the following.
By default, the tripping times in compliance with the EN 60364-4-41 standard are preset. The
EN 60364-4-41 standard defines different tripping times for TN/IT networks and TT networks as
can be seen in table 41.1.
Tripping times in compliance with
EN 60364-4-41
:
Uo
½
I
N
*)
I
N
2
I
N
5
I
N
TN/IT
≤120 V t
> 800 ms
t
≤ 800 ms
t
< 150 ms
t
< 40 ms
≤230 V t
> 400 ms
t
≤ 400 ms
TT
≤120 V t
> 300 ms
t
≤ 300 ms
≤230 V t
> 200 ms
t
≤ 200 ms
Uo: Nominal voltage of external conductor to earth
Example of a tripping time evaluation for I
N
, Uo: ≤230 V
Setting
Tripping time
t
Evaluation field
IEC 60364-4-41 TN/IT
< 400 ms
400 ms <
t
< 999 ms
> 999 ms
IEC 60364-4-41 TT
< 200 ms
200 ms <
t
< 999 ms
> 999 ms
Tripping times in compliance with
EN 61008/EN 61009:
½
I
N
*)
I
N
2
I
N
5
I
N
Standard RCDs
(undelayed)
t
> 300 ms
t
< 300 ms
t
< 150 ms
t
< 40 ms
Selective RCDs
(delayed)
t
> 500 ms
130 ms< t
< 500 ms 60 ms< t
< 200 ms
50 ms< t
< 150 ms
Tripping times in compliance with
BS 7671:
½
I
N
*)
I
N
2
I
N
5
I
N
Standard RCDs
(undelayed)
t
> 1999 ms t
< 300 ms
t
< 150 ms
t
< 40 ms
Selective RCDs
(delayed)
t
> 1999 ms 130 ms< t
< 500 ms 60 ms< t
< 200 ms
50 ms< t
< 150 ms
Tripping times in compliance with
AS/NZS 3017
**)
:
½
I
N
*)
I
N
2
I
N
5
I
N
RCD type I
N
[mA]
t
t
t
t
Remark
I
10
> 999 ms
40 ms 40 ms
40 ms
maximum tripping time
II
> 10
30
300 ms 150 ms
40 ms
III
> 30
300 ms 150 ms
40 ms
IV
S
> 30
> 999 ms
500 ms 200 ms 150 ms
130 ms 60 ms
50 ms minimum non-tripping time
*)
Minimum testing time for a current of ½
I
N
, RCD must not trip
**)
Testing current and measuring accuracy correspond to the requirements specified by
AS/NZS 3017
