Atmel SAM9X25, Manual

Page: 45 / 1145

45
11054A–ATARM–27-Jul-11
SAM9X25
45
11054A–ATARM–27-Jul-11
SAM9X25
10. Debug and Test
10.1 Description
The SAM9X25 features a number of complementary debug and test capabilities. A common
JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as down-
loading code and single-stepping through programs. The Debug Unit provides a two-pin UART
that can be used to upload an application into internal SRAM. It manages the interrupt handling
of the internal COMMTX and COMMRX signals that trace the activity of the Debug Communica-
tion Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
10.2 Embedded Characteristics
• ARM926 Real-time In-circuit Emulator
– Two real-time Watchpoint Units
– Two Independent Registers: Debug Control Register and Debug Status Register
– Test Access Port Accessible through JTAG Protocol
– Debug Communications Channel
• Debug Unit
– Two-pin UART
– Debug Communication Channel Interrupt Handling
– Chip ID Register
• IEEE1149.1 JTAG Boundary-scan on All Digital Pins
.