SAM4C32-EK [USER GUIDE]
Atmel-11253A-ATARM-SAM4C32-EK-UserGuide_17-Sep-14
11
Figure 3-6.
Power Rails Schematic
Note:
Test points and jumpers are provided for easy access to each of the regulated power lines and measure the current on
each line.
3.3.6
Battery Backup
The VDDBU pin is powered from the 3.3V rail or from a backup battery BT1 via a dual Schottky diode D4.
Test points TP8 and jumper JP8/JP10 are used to perform voltage and current measurements.
Figure 3-7.
Backup Battery Schematic
3.4
Embedded Memories
I2C for data storage in EEPROM (Atmel AT24C1024B)
SPI Serial Flash AT45 or AT25F
3.4.1
TWI EEPROM
The AT24C1024B provides 1,048,576 bits of serial electrically erasable and programmable read-only memory
(EEPROM) organized as 131,072 words of 8 bits each.
Device slave address byte: 0x50.
V
out
= 0.8 x (1 + R
top
/R
bottom
)
3V3 POWER
FORCE
POWER
ON
FORCE_ON
FORCE_ON
5V
5V
3V3
3V3
SHDN
{3}
TP7
Q1
Si1563EDH
Q1
Si1563EDH
1
3
2
4
5
6
R15
100K
Ω
R15
100
C43
15pF
C43
C39
10µF
C38
1µF
C38
C41
1µF
R14
100K
Ω
R14
D5
RED
RED
R16
47K
Ω
1%
U2 RT9018A
U2 RT9018A
PGOOD
1
EN
2
VIN
3
VDD
4
NC
5
VOUT
6
ADJ
7
GND
8
VSS
9
C35
10nF
C35
R20
R20
10K
Ω
R18
15
15K
Ω
1%
C36
100nF
C36
JP9
JP9
R19
R19
10K
Ω
C44
1µF
C44
R17
470
Ω
C37
10µF
C37
close to SAM4C32
VDDOUT
VDDCORE
VDDPLL
C34
22µF
C34
22
JP6
JP6
L2
L2
56µH
TP6
TP6
R13
2.2R
R13
.
C32
2.2µF/DNP
C32
C33
100nF
C33
100nF
JP7
JP7
TP5
TP5
VDDMAIN
3V3
VDDIN
VDDIO
TP10
TP10
JP13
JP13
TP12
TP12
JP12
JP12
TP11
TP11
JP11
JP11
Power LED
Do Not Populate
VDDBU
VBATT
VDDIN
VDDBU
BT1
JP10
C42
100nF
C40
2.2µF
TP8
D4
BAT54C
D4
BAT54C
3
2
1
JP8
