Debug Support
5-14
Copyright © 1998, 1999 ARM Limited. All rights reserved.
ARM DDI0145B
5.5.4
Public instructions
The following public instructions are supported:
In the descriptions that follow,
TDI
and
TMS
are sampled on the rising edge of
TCK
and all output transitions on
TDO
occur as a result of the falling edge of
TCK
.
EXTEST (0000)
The selected scan chain is placed in test mode by the EXTEST instruction.
The EXTEST instruction connects the selected scan chain between
TDI
and
TDO
.
When the instruction register is loaded with the EXTEST instruction, all the scan cells
are placed in their test mode of operation.
In the CAPTURE-DR state, inputs from the system logic and outputs from the output
scan cells to the system are captured by the scan cells.
In the SHIFT-DR state, the previously captured test data is shifted out of the scan chain
via
TDO
, while new test data is shifted in via the
TDI
input. This data is applied
immediately to the system logic and system pins.
Table 5-1 Public instructions
Instruction
Binary code
EXTEST
0000
SCAN_N
0010
INTEST
1100
IDCODE
1110
BYPASS
1111
CLAMP
0101
HIGHZ
0111
CLAMPZ
1001
SAMPLE/PRELOAD
0011
RESTART
0100
Summary of Contents for ARM9TDMI
Page 6: ...Contents vi Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 12: ...Preface xii Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 16: ...Introduction 1 4 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 22: ...Programmer s Model 2 6 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 110: ...Test Issues 6 6 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 154: ...Index Index 4 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...