Test Issues
6-2
Copyright © 1998, 1999 ARM Limited. All rights reserved.
ARM DDI0145B
6.1
About testing
The ARM9TDMI processor core supports parallel and serial test methodologies. The
parallel test patterns are derived from assembler ARM code programs written to achieve
a high fault coverage.
The ARM9TDMI processor core has a fully JTAG-compatible scan chain which
intersects all the inputs and outputs. This allows the test patterns to be serialized and
injected to the processor via the JTAG interface. Both the parallel and serial test patterns
are supplied to ARM9TDMI processor core licensees. The scan chain also supports
EXTEST, allowing the connections between the ARM9TDMI processor core and other
JTAG-compatible peripherals to be tested.
Summary of Contents for ARM9TDMI
Page 6: ...Contents vi Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 12: ...Preface xii Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 16: ...Introduction 1 4 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 22: ...Programmer s Model 2 6 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 110: ...Test Issues 6 6 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Page 154: ...Index Index 4 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...