Ametek Western Research IPS-4, User Manual

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Overview | 1-1
OVERVIEW
This chapter discusses the features of the IPS-4 Analyzer and a summary
of how the entire system operates. This chapter also provides an overview
of the AMETEK electronics, Dual Bench options, sample systems, and the
various sub-systems that make up the entire analyzer system.
Optical Bench Configurations
The Dual Bench option of the IPS-4 incorporates both a dispersive ul-
traviolet/visible (DUVV) spectrometer and a non-dispersive infrared
(NDIR) photometer. This section describes how the IPS-4 integrates the
information obtained from both optical systems. Specific information for
the DUVV and NDIR optical systems, including theory, hardware and
software descriptions, and installation instructions are provided, under
sections DUVV OPTICAL BENCH and NDIR OPTICAL BENCH.
Basic Analytical Theory (Optical Bench)
For this analyzer, the analytical measurement is transmittance, T
( )
λ
l
, over
one or more bands of wavelength
( )
λ
l
. Transmittance is the ratio of the
transmitted power (originating from the source),
( )
λ
l
to the incident
power,
( )
λ
0
Ι
for each wavelength (see Equation 1.1).
( ) ( ) ( )
λ / λ λ
0
λ λ
= Τ
Equation 1.1
Flow Diagram
Both the DUVV and NDIR Optical Benches operate in parallel to mea-
sure transmittance. Figure 1-1 illustrates the flow of information from the
DUVV and NDIR Optical Benches to the IPS-4 analyzer platform. A single
PCB acts as the interface between the Optical Benches and the MCU
board where the signal processing occurs.