ABB RES670 2.1, Commissioning Manual

Page: 147 / 202

1. Check that the IED settings are appropriate, for example the PUFrequency , VMin ,
and the tDelay .
2. Supply the IED with three-phase voltages at rated values.
3. Slowly decrease the magnitude of the applied voltage, until the BLKDMAGN signal
appears.
4. Note the voltage magnitude value and compare it with the set value VMin .
5. Slowly decrease the frequency of the applied voltage, to a value below
PUFrequency .
6. Check that the PICKUP signal does not appear.
7. Wait for a time corresponding to tDelay , make sure that the TRIP signal does not
appear.
11.6.1.2 Completing the test
Continue to test another function or end the test by changing the TestMode setting to
Disabled . Restore connections and settings to their original values, if they were changed
for testing purposes.
11.6.2 Overfrequency protection SAPTOF (81)
Prepare the IED for verification of settings outlined in section "Preparing the IED to verify
settings" .
11.6.2.1 Verifying the settings
Verification of PICKUP value and time delay to trip
1. Check that the settings in the IED are appropriate, for example the PICKUP value
and the time delay.
2. Supply the IED with three-phase voltages at their rated values.
3. Slowly increase the frequency of the applied voltage, until the PICKUP signal
appears.
4. Note the trip value and compare it with the set value.
5. Decrease the frequency to rated operating conditions.
6. Check that the PICKUP signal resets.
7. Instantaneously increase the frequency of the applied voltage to a value about 1%
lower than the trip value (a step change more than 2% will increase the time delay).
8. Measure the time delay for the TRIP signal, and compare it with the set value. Note
that the measured time consists of the set value for time delay plus minimum trip
time of the pickup function (80 - 90 ms).
Extended testing
1MRK 511 366-UUS -
Section 11
Testing functionality by secondary injection
141
Commissioning manual