11.5.2.3
Completing the test
Continue to test another function or end the test by changing the
TestMode
setting to
Disabled
. Restore connections and settings to their original values, if they were changed
for testing purposes.
11.6
Frequency protection
11.6.1
Underfrequency protection SAPTUF (81)
Prepare the IED for verification of settings outlined in section
.
11.6.1.1
Verifying the settings
Verification of PICKUP value and time delay to trip
1.
Check that the IED settings are appropriate, for example the PICKUP value and the
time delay.
2.
Supply the IED with three-phase voltages at their rated values.
3.
Slowly decrease the frequency of the applied voltage, until the PICKUP signal
appears.
4.
Note the operate value and compare it with the set value.
5.
Note the trip value and compare it with the set value.
6.
Increase the frequency until rated operating levels are reached.
7.
Check that the PICKUP signal resets.
8.
Instantaneously decrease the frequency of the applied voltage to a value about 1%
lower than the trip value (a step change more than 2% will increase the time delay).
9.
Measure the time delay of the TRIP signal, and compare it with the set value. Note
that the measured time consists of the set value for time delay plus minimum trip
time of the pickup start function (80 - 90 ms).
Extended testing
1.
The test above can be repeated to check the time to reset.
2.
The tests above can be repeated to test the frequency dependent inverse time
characteristic.
Verification of the low voltage magnitude blocking
Section 11
1MRK 511 366-UUS -
Testing functionality by secondary injection
140
Commissioning manual
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